Nachdem mein Rechner nun doch vermehrt abstürzt, finde ich im syslog folgende Einträge, die jedoch nicht umbedingt von Absturzzeitpunkt sind. Aber vielleicht hat meine Platte ja doch ein Problem!?
Um 09:23 Uhr kam folgender syslog-Eintrag
Jan 15 09:23:06 vdr smartd[1699]: Device: /dev/hda, SMART Usage Attribute: 194 Temperature_Celsius changed from 148 to 139
Jan 15 09:30:01 vdr /USR/SBIN/CRON[1874]: (vdr) CMD (/home/vdr/addon/master-timer/run-mt.pl >/dev/null 2>&1)
Um 09:30 hat er also noch gelebt, um 09:40 hätte der nächste master-timer-Lauf kommen müssen, da stand die Kiste schon.
Ein smartctl -a /dev/hda liefert:
vdr:~# smartctl -a /dev/hda
smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
Home page is [URL]http://smartmontools.sourceforge.net/[/URL]
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SV1203N
Serial Number: 0653J1FWC00287
Firmware Version: TQ100-24
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sat Jan 15 14:40:46 2005 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (5400) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 90) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 61
3 Spin_Up_Time 0x0007 072 060 000 Pre-fail Always - 5056
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 542
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0024 090 089 000 Old_age Offline - 9802
9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 923h+49m
10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 365
194 Temperature_Celsius 0x0022 157 103 000 Old_age Always - 27
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 171383938
196 Reallocated_Event_Count 0x0012 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0
198 Offline_Uncorrectable 0x0031 253 253 010 Pre-fail Offline - 0
199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail Always - 51
200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 1
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 848 hours (35 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
02 51 00 00 00 00 a0 Error: TK0NF
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
10 ff 00 00 00 00 a0 00 00:30:05.438 RECALIBRATE [OBS-4]
00 00 01 01 00 00 a0 00 00:30:05.438 NOP [Abort queued commands]
90 00 05 01 00 00 a0 00 00:30:02.875 EXECUTE DEVICE DIAGNOSTIC
00 d0 01 01 00 00 a0 00 00:29:52.000 NOP [Reserved subcommand]
b0 d0 00 01 4f c2 a0 00 00:29:26.063 SMART READ DATA
Error 13 occurred at disk power-on lifetime: 844 hours (35 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 01 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d1 01 01 4f c2 e0 00 00:12:54.438 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
Error 12 occurred at disk power-on lifetime: 844 hours (35 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 e0 00 00:12:54.313 SMART READ DATA
Error 11 occurred at disk power-on lifetime: 844 hours (35 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 01 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d1 01 01 4f c2 e0 00 00:12:53.938 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
Error 10 occurred at disk power-on lifetime: 844 hours (35 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 00 4f c2 e0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 e0 00 00:12:53.750 SMART READ DATA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 848 -
# 2 Short offline Completed without error 00% 844 -
Device does not support Selective Self Tests/Logging
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